<Development of a DC arc model for faults in DC equipment and DC power systems>
When a short-circuit arc or ground-fault arc (parallel arc) occurs in a DC circuit, the current value increases significantly, making detection easy. However, when a series arc occurs in a DC circuit due to loose terminals or minute wire breakage, the current value decreases only slightly, making detection difficult. To prevent public accidents caused by such arcs in DC circuits, we are conducting basic research to develop a detection technology for series arcs.
-Related Papers-
* N. Nishiyama, M. Iwata, Y. Yokomizu, N. Kodama, M.S.S. Danish: “Trial of Current Waveform Analysis for DC Series Arcs Using Wavelet Transformation -Towards Development of Detecting Technology for Fault Arcs in DC Facilities-“, 2023 Annual Meeting of the Institute of Electrical Engineers of Japan, No. 7-036, Nagoya, Japan (Mar. 2023)
* N. Nishiyama, M. Iwata, Y. Yokomizu, N. Kodama: “Trial Application of Wavelet Transformation to Low Voltage DC Series Arc Detection Method”, Joint Technical Meeting on “Electrical Discharges, Plasma and Pulsed Power”, “Static Apparatus” and “Switching and Protecting Engineering”, IEE Japan, EPP-23-049/SA-23-033/SP-23-001, pp. 1-5, Kanazawa, Japan (Jul. 2023)
* N. Nishiyama, M. Iwata, Y. Yokomizu, N. Kodama: “Wavelet Transformation Analysis of Low Voltage DC Series Arcs under Different Current Conditions -Towards Development of Detecting Technology for Fault Arcs in DC Facilities-“, Tokai-Section Joint Conference on Electrical, Electronics, Information, and Related Engineering, B1-1, Toyohashi, Japan (Aug.2023)
* N. Nishiyama, M. Iwata, Y. Yokomizu, N. Kodama, T. Sakai, M. Tsukahara, A. Miyamoto: “Wavelet Analysis for detecting low-voltage DC short-gap under different voltage conditions”, 2024 Annual Meeting of the Institute of Electrical Engineers of Japan, No. 6-038, Tokushima, Japan (Mar. 2024)
* N. Nishiyama, M. Iwata, Y. Yokomizu, N. Kodama, A. Nakamura, T. Sakai, M. Tsukahara, A. Miyamoto: “Fundamental Study on Low Voltage DC Series Arc Detection Method – Wavelet Analysis of Currents Supposing Faults in DC Facilities -”, The 2024 Annual Conference of Power and Energy Society IEE of Japan, No. 238，pp. 8_1_3 – 8_1_4, Osaka, Japan (Sep. 2024)
* N. Nishiyama, M. Iwata, Y. Yokomizu, N. Kodama, A. Nakamura, T. Sakai, M. Tsukahara, A. Miyamoto: “Fundamental Study of Wavelet Analysis Method to Detect Short-gap Arcs in Low Voltage DC Facilities -Analysis Frequency: 1 kHz – 10 kHz-”, 14th International Workshop on High Voltage Engineering (IWHV 2024), EPP-24-077/SP-24-018/HV-24-079, Kagoshima, Japan (Nov. 2024)
* M. Iwata, N. Nishiyama, Y. Yokomizu, N. Kodama, A. Nakamura, T. Sakai, M. Tsukahara, A. Miyamoto: “A Proposal for a Detection Method of Short-gap Arcs Generated in Low-voltage DC Facilities”, IEEJ PES-IEEE PES Thailand Joint Symposium on Advanced Technology in Power Systems 2025, No. TJS-25-007 (Mar. 2025)
* N. Nishiyama, M. Iwata, Y. Yokomizu, N. Kodama, A. Nakamura, K. Ishikawa, T. Sakai, M. Tsukahara, A. Miyamoto: “Wavelet analysis for low-voltage DC series arc detection at different inter-electrode distances”, 2025 Annual Meeting of the Institute of Electrical Engineers of Japan, No. 6-029, Tokyo, Japan (Mar. 2025)
<Development of Verification Methods for Short-Circuit and Arc-Resistant Performance of DC Power Equipment>
In the IEC standard for HVDC power equipment that is currently being established, it is being considered to conduct an alternative test using AC. As a first step in studying the basic conditions for such alternative tests, we are comparing the current density distribution, the resistance components, and the temperature distribution of copper and aluminum cylindrical conductors when energized by AC and when energized by DC.
-Related Papers-
* Y. Shigemura, Y. Yokomizu, M. Iwata, N. Kodama, M.S.S. Danish: “Variation of Resistance Components of a Cylindrical Conductor of AC and DC Energization —Towards Development of Verification Method for Short-Circuit Performance of Electric Power DC Equipment—”, Tokai-Section Joint Conference on Electrical, Electronics, Information, and Related Engineering, D4-5, Online, Japan (Aug.2022)
* Y. Shigemura, Y. Yokomizu, M. Iwata, N. Kodama, M.S.S. Danish: “Analysis of Temperature Rise during AC and DC Current Flow in a Horizontally Installed Cylindrical Conductor -Towards Development of Verification Method for Short-Circuit Performance of Electric Power DC Equipment-“, 2023 Annual Meeting of the Institute of Electrical Engineers of Japan, No. 6-056, Nagoya University, Japan (Mar. 2023)
* Y. Shigemura, Y. Yokomizu, M. Iwata, N. Kodama: “Analysis of Current Density Distribution in a Copper Cylinder Conductor with Time Variation of Current —Towards Development of Verification Method for Short-Circuit Performance of Electric Power DC Equipment-“, Tokai-Section Joint Conference on Electrical, Electronics, Information, and Related Engineering, B1-4, Toyohashi, Japan (Aug.2023)
* Y. Shigemura, Y. Yokomizu, M. Iwata, N. Kodama: “Analysis of Surface Temperature Rise of an Aluminum Cylindrical Conductor —Toward the Development of a Method for Verifying the Short-Circuit Performance of Power DC Equipment- “, The 2023 Annual Conference of Power and Energy Society IEE of Japan, No. 262，pp. 9_6_15 – 9_6_16, Toyota, Japan (Sep.2023)
* Y. Shigemura, Y. Yokomizu, M. Iwata, N. Kodama: “Derivation of Electrical Resistance of Pipe Conductor by Analysis of AC Current Density Phasor —Towards Development of Alternative Testing with AC for Power DC Equipment-”, 2024 Annual Meeting of the Institute of Electrical Engineers of Japan, No. 6-037, Tokushima, Japan (Mar. 2024)
* Y. Go, Y. Yokomizu, M. Iwata, N. Kodama, A. Nakamura: “Derivation of Electrical Resistance in Aluminum Hollow Cylindrical Conductor Considering Skin Effect”, Tokai-Section Joint Conference on Electrical, Electronics, Information, and Related Engineering, B6-1, Gifu, Japan (Aug. 2024)
* Y. Go, Y. Yokomizu, M. Iwata, N. Kodama, A. Nakamura: “Radial distribution of Joule heating and temperature rise in a copper hollow cylindrical conductor – Toward the development of alternative testing with AC for power DC equipment –”, 2025 Annual Meeting of the Institute of Electrical Engineers of Japan, No. 6-045, Tokyo, Japan (Mar. 2025)